Invention Grant
US07836343B2 Method and apparatus for reducing test case generation time in processor testing
有权
处理器测试中减少测试用例生成时间的方法和设备
- Patent Title: Method and apparatus for reducing test case generation time in processor testing
- Patent Title (中): 处理器测试中减少测试用例生成时间的方法和设备
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Application No.: US12041071Application Date: 2008-03-03
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Publication No.: US07836343B2Publication Date: 2010-11-16
- Inventor: Guo H. Feng , Pedro Martin-de-Nicolas
- Applicant: Guo H. Feng , Pedro Martin-de-Nicolas
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Yee & Associates, P.C.
- Agent Matthew W. Baca
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A method, apparatus and computer program product are provided for use in a system that includes one or more processors, and multiple threads that are respectively associated with the one or more processors. One embodiment of the invention is directed to a method that includes the steps of generating one or more test cases, wherein each test case comprises a specified set of instructions in a specified order, and defining a plurality of thread hardware allocations, each corresponding to a different one of the threads. The thread hardware allocation corresponding to a given thread comprises a set of processor hardware resources that are allocated to the given thread for use in executing test cases. The method further includes executing a particular one of the test cases on a first thread hardware allocation, in order to provide a first set of test data, and thereafter executing the particular test case using a second thread hardware allocation, in order to provide a second set of test data.
Public/Granted literature
- US20090222647A1 Method and Apparatus for Reducing Test Case Generation Time in Processor Testing Public/Granted day:2009-09-03
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