Invention Grant
US07839134B2 Method and apparatus for simultaneously detecting size and concentration of ionic material
有权
用于同时检测离子材料的尺寸和浓度的方法和装置
- Patent Title: Method and apparatus for simultaneously detecting size and concentration of ionic material
- Patent Title (中): 用于同时检测离子材料的尺寸和浓度的方法和装置
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Application No.: US11619650Application Date: 2007-01-04
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Publication No.: US07839134B2Publication Date: 2010-11-23
- Inventor: Kyu-sang Lee , Kyu-tae Yoo , Jeo-young Shim , Won-seok Chung , Yeon-ja Cho
- Applicant: Kyu-sang Lee , Kyu-tae Yoo , Jeo-young Shim , Won-seok Chung , Yeon-ja Cho
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Cantor Colburn LLP
- Priority: KR10-2006-0029807 20060331
- Main IPC: G01N27/00
- IPC: G01N27/00

Abstract:
A method for simultaneously detecting a size and concentration of ionic materials includes measuring voltage drop values of at least three ionic materials of which sizes and concentrations are known using each of at least two FET-based sensors having different electrical characteristics, determining at least three points in a three-dimensional plot from the known sizes, concentrations and the measured voltage drop values, approximating the at least three points into a single plane, measuring a voltage drop value of an ionic material of which size and concentration are unknown using the at least two FET-based sensors, determining equipotential lines existing on the plane using the voltage drop value of the unknown ionic material and determining a cross point between each of the equipotential lines.
Public/Granted literature
- US20070251301A1 METHOD AND APPARATUS FOR SIMULTANEOUSLY DETECTING SIZE AND CONCENTRATION OF IONIC MATERIAL Public/Granted day:2007-11-01
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