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US07840375B2 Methods and apparatus for generating a library of spectra 有权
用于生成光谱库的方法和装置

Methods and apparatus for generating a library of spectra
Abstract:
A method of generating a library from a reference substrate for use in processing product wafers is described. The method includes measuring substrate characteristics at a plurality of well-defined points of a reference substrate, measuring spectra at plurality of measurement points of the reference substrate, there being more measurement points than well-defined points, and associating measured spectra with measured substrate characteristics.
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