Invention Grant
US07844403B2 Temperature step correction with double sigmoid Levenberg-Marquardt and robust linear regression
有权
双重Sigmoid Levenberg-Marquardt的温度阶梯校正和鲁棒线性回归
- Patent Title: Temperature step correction with double sigmoid Levenberg-Marquardt and robust linear regression
- Patent Title (中): 双重Sigmoid Levenberg-Marquardt的温度阶梯校正和鲁棒线性回归
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Application No.: US11458644Application Date: 2006-07-19
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Publication No.: US07844403B2Publication Date: 2010-11-30
- Inventor: Ronald T. Kurnik
- Applicant: Ronald T. Kurnik
- Applicant Address: US CA Pleasanton
- Assignee: Roche Molecular Systems, Inc.
- Current Assignee: Roche Molecular Systems, Inc.
- Current Assignee Address: US CA Pleasanton
- Agency: Townsend and Townsend and Crew LLP
- Agent Gerald T. Gray
- Main IPC: G01N33/48
- IPC: G01N33/48

Abstract:
Systems and methods for improving Ct determination in PCR amplification curves by correcting PCR data for temperature shifts that may occur during the PCR process. A double sigmoid function with parameters determined by a Levenberg-Marquardt (LM) regression process is used to find an approximation to the portion of the curve in the region after the temperature shift, termed “CAC”, the cycle where the temperature shift occurred. A robust linear approximation is determined for the portion of the curve in the region before the temperature shift. Values of the fluorescent intensity for the cycle CAC or CAC+1 are determined using both the linear approximation and the LM process, and a difference in these values is subtracted off of the portion of the data set representing the portion of the curve before the temperature shift occurred to produce a shift-corrected data set. The shift-corrected data set may be displayed or otherwise used for further processing.
Public/Granted literature
- US20080033701A1 TEMPERATURE STEP CORRECTION WITH DOUBLE SIGMOID LEVENBERG-MARQUARDT AND ROBUST LINEAR REGRESSION Public/Granted day:2008-02-07
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