Invention Grant
- Patent Title: Particulate material detecting apparatus
- Patent Title (中): 颗粒物检测装置
-
Application No.: US12542805Application Date: 2009-08-18
-
Publication No.: US07846241B2Publication Date: 2010-12-07
- Inventor: Atsuo Kondou , Takeshi Sakuma , Yasumasa Fujioka
- Applicant: Atsuo Kondou , Takeshi Sakuma , Yasumasa Fujioka
- Applicant Address: JP Nagoya
- Assignee: NGK Insulators, Ltd.
- Current Assignee: NGK Insulators, Ltd.
- Current Assignee Address: JP Nagoya
- Agency: Burr & Brown
- Priority: JP2007-066675 20070315
- Main IPC: B03C3/12
- IPC: B03C3/12 ; B03C3/68

Abstract:
A particulate matter detecting apparatus (100) includes a detecting apparatus main body having a cavity (2) that is formed through the detecting apparatus main body, a particle charging section (3) that can charge particulate matter that has entered the cavity through an inflow-side end (6) of the cavity, a collection section (4) that can collect the particulate matter charged by the particle charging section (3) and measure the amount of the particulate matter, and an ion wind generation section (5) that allows the particulate matter charged by the particle charging section (3) to flow toward an outflow-side end (7) of the cavity, the particle charging section, the collection section (4), and the ion wind generation section (5) being provided inside the cavity in this order from the inflow-side end (6). The particulate matter detecting apparatus has a reduced size, shows only a small measurement error, and can be produced inexpensively.
Public/Granted literature
- US20090308251A1 PARTICULATE MATERIAL DETECTING APPARATUS Public/Granted day:2009-12-17
Information query
IPC分类: