An MCM-22 family molecular sieve having an X-ray diffraction pattern of the as-synthesized MCM-22 family molecular sieve including d-spacing maxima at 12.4±0.25, 3.57±0.07 and 3.42±0.07 Angstroms and at least one peak between 26.6° and 29° (2θ). The peak between 26.6° to 29° (2θ) has a two theta (2θ) of about 26.9°. A method of manufacturing an MCM-22 family molecular sieve, said method comprising the steps of (a) combining at least one silicon source, at least one source of alkali metal hydroxide, at least one directing-agent (R), water, and optionally one aluminum source, to form a mixture having the following mole composition: Si:Al2=10 to infinity H2O:Si=1 to 20 OH−:Si=0.001 to 2 M+:Si=0.001 to 2 R:Si=0.001 to 0.34 wherein M is an alkali metal; (b) treating said mixture at crystallization conditions for less than 72 hr to form a treated mixture having said MCM-22 family molecular sieve, wherein said crystallization conditions comprises a temperature range from about 160° C. to about 250° C.; and (c) recovering said MCM-22 family molecular sieve.