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US07846821B2 Multi-angle rotation for ion implantation of trenches in superjunction devices 有权
多角度旋转用于离子注入超导结器件中的沟槽

Multi-angle rotation for ion implantation of trenches in superjunction devices
Abstract:
A method of manufacturing a semiconductor device includes providing a semiconductor wafer and forming at least one first trench in the wafer having first and second sidewalls and a first orientation on the wafer. The first sidewall of the at least one first trench is implanted with a dopant of a first conductivity at a first implantation direction. The first sidewall of the at least one first trench is implanted with the dopant of the first conductivity at a second implantation direction. The second implantation direction is orthogonal to the first implantation direction. The first and second implantation directions are non-orthogonal to the first sidewall.
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