Invention Grant
US07846821B2 Multi-angle rotation for ion implantation of trenches in superjunction devices
有权
多角度旋转用于离子注入超导结器件中的沟槽
- Patent Title: Multi-angle rotation for ion implantation of trenches in superjunction devices
- Patent Title (中): 多角度旋转用于离子注入超导结器件中的沟槽
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Application No.: US12371025Application Date: 2009-02-13
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Publication No.: US07846821B2Publication Date: 2010-12-07
- Inventor: Takeshi Ishiguro , Hugh J. Griffin , Kenji Sugiura
- Applicant: Takeshi Ishiguro , Hugh J. Griffin , Kenji Sugiura
- Applicant Address: GB Belfast
- Assignee: Icemos Technology Ltd.
- Current Assignee: Icemos Technology Ltd.
- Current Assignee Address: GB Belfast
- Agency: Panitch Schwarze Belisario & Nadel LLP
- Main IPC: H01L21/425
- IPC: H01L21/425

Abstract:
A method of manufacturing a semiconductor device includes providing a semiconductor wafer and forming at least one first trench in the wafer having first and second sidewalls and a first orientation on the wafer. The first sidewall of the at least one first trench is implanted with a dopant of a first conductivity at a first implantation direction. The first sidewall of the at least one first trench is implanted with the dopant of the first conductivity at a second implantation direction. The second implantation direction is orthogonal to the first implantation direction. The first and second implantation directions are non-orthogonal to the first sidewall.
Public/Granted literature
- US20090200634A1 MULTI-ANGLE ROTATION FOR ION IMPLANTATION OF TRENCHES IN SUPERJUNCTION DEVICES Public/Granted day:2009-08-13
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