Invention Grant
- Patent Title: Configurable prober for TFT LCD array test
- Patent Title (中): 可配置探针用于TFT LCD阵列测试
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Application No.: US11940432Application Date: 2007-11-15
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Publication No.: US07847566B2Publication Date: 2010-12-07
- Inventor: Matthias Brunner , Shinichi Kurita , Ralf Schmid , Fayez (Frank) E. Abboud , Benjamin Johnston , Paul Bocian , Emanuel Beer
- Applicant: Matthias Brunner , Shinichi Kurita , Ralf Schmid , Fayez (Frank) E. Abboud , Benjamin Johnston , Paul Bocian , Emanuel Beer
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, LLP
- Main IPC: G01R31/26
- IPC: G01R31/26
Abstract:
A method of testing electronic devices on substrates is described. The method includes placing a configurable prober over a first substrate, testing the first substrate, re-configuring the configurable prober, placing the configurable prober over a second substrate, and testing the second substrate.
Public/Granted literature
- US20080061807A1 Configurable Prober for TFT LCD Array Test Public/Granted day:2008-03-13
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