Invention Grant
- Patent Title: Semiconductor memory device compensating leakage current
- Patent Title (中): 半导体存储器件补偿漏电流
-
Application No.: US12124799Application Date: 2008-05-21
-
Publication No.: US07848171B2Publication Date: 2010-12-07
- Inventor: Satoyuki Miyako
- Applicant: Satoyuki Miyako
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Turocy & Watson, LLP
- Priority: JP2007-140340 20070528
- Main IPC: G11C5/14
- IPC: G11C5/14

Abstract:
A cell array has a plurality of memory cells arranged in a matrix. Each one terminal of a plurality of switching circuits is connected to a bit line. A leakage current compensating circuit has an output node connected in common to the other terminal of the switching circuit. The leakage current compensating circuit comprises a plurality of MOSFETs. Each MOSFET has the same conduction type as a MOSFET whose output node is directly connected to the bit line in the memory cell. Each MOSFET of the leakage current compensating circuit has a gate electrode connected to a first voltage node and a source electrode connected to a second voltage node, and thereby, being biased so that the MOSFET turns off.
Public/Granted literature
- US20080298155A1 SEMICONDUCTOR MEMORY DEVICE COMPENSATING LEAKAGE CURRENT Public/Granted day:2008-12-04
Information query