Invention Grant
US07851887B2 Phase change memory device with heater electrodes having fine contact area and method for manufacturing the same 有权
具有具有良好接触面积的加热器电极的相变存储器件及其制造方法

  • Patent Title: Phase change memory device with heater electrodes having fine contact area and method for manufacturing the same
  • Patent Title (中): 具有具有良好接触面积的加热器电极的相变存储器件及其制造方法
  • Application No.: US12344777
    Application Date: 2008-12-29
  • Publication No.: US07851887B2
    Publication Date: 2010-12-14
  • Inventor: Min Seok Son
  • Applicant: Min Seok Son
  • Applicant Address: KR Gyeonggi-do
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Agency: Ladas & Parry LLP
  • Priority: KR10-2008-0092222 20080919
  • Main IPC: H01L23/58
  • IPC: H01L23/58
Phase change memory device with heater electrodes having fine contact area and method for manufacturing the same
Abstract:
A phase change memory device includes a semiconductor substrate having a conductive region, a heater electrode formed on the semiconductor substrate and including a connection element which is composed of carbon nanotubes electrically connected with the conductive region, and a phase change pattern layer contacting the connection element of the heater electrode.
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