Invention Grant
- Patent Title: Optical-scanning microscope examination apparatus
- Patent Title (中): 光学扫描显微镜检查仪
-
Application No.: US11628762Application Date: 2005-06-09
-
Publication No.: US07852551B2Publication Date: 2010-12-14
- Inventor: Mitsuhiro Hara , Hiroshi Tosaka , Akihiro Horii , Kazunari Tokuda , Yoshihisa Tanikawa
- Applicant: Mitsuhiro Hara , Hiroshi Tosaka , Akihiro Horii , Kazunari Tokuda , Yoshihisa Tanikawa
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Pillsbury Winthrop Shaw Pittman, LLP
- Priority: JP2004-175520 20040614; JP2004-214573 20040722
- International Application: PCT/JP2005/010596 WO 20050609
- International Announcement: WO2005/121862 WO 20051222
- Main IPC: G02B21/00
- IPC: G02B21/00

Abstract:
A clear image having suppressed blurring due to pulsing is obtained by in-vivo examination of biological tissue or various internal organs of mammals, including small laboratory animals. The invention provides an optical-scanning microscope examination apparatus including a light source; a light-transmitting member for transmitting light from the light source; a collimator optical system for converting the transmitted light to a collimated beam; a beam-scanning unit for scanning the collimated beam on a subject; a focusing optical system for focusing the scanned beam onto the subject; a pupil-projection optical system; a light detector for detecting return light returning from the subject via the focusing optical system, the pupil-projection optical system, the beam-scanning unit, the collimator optical system, and the light-transmitting member; an actuator for moving the collimator optical system in an optical-axis direction; a control apparatus for controlling driving thereof; and a deflecting mechanism for deflecting the light issuing from the light-transmitting member in a direction intersecting the optical axis thereof, wherein the actuator is disposed in a space parallel to a plane including optical axes before and after deflection by the deflecting mechanism.
Public/Granted literature
- US20080130103A1 Optical-Scanning Microscope Examination Apparatus Public/Granted day:2008-06-05
Information query