Invention Grant
US07852983B2 X-ray diffractometer for mechanically correlated movement of the source, detector, and sample position
有权
用于源,检测器和样品位置的机械相关运动的X射线衍射仪
- Patent Title: X-ray diffractometer for mechanically correlated movement of the source, detector, and sample position
- Patent Title (中): 用于源,检测器和样品位置的机械相关运动的X射线衍射仪
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Application No.: US12385685Application Date: 2009-04-16
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Publication No.: US07852983B2Publication Date: 2010-12-14
- Inventor: Kai Uwe Mettendorf , Claus Bolzinger , Joachim Lange
- Applicant: Kai Uwe Mettendorf , Claus Bolzinger , Joachim Lange
- Applicant Address: DE Karlsruhe
- Assignee: Bruker AXS GmbH
- Current Assignee: Bruker AXS GmbH
- Current Assignee Address: DE Karlsruhe
- Agent Paul Vincent
- Priority: DE102008020108 20080422
- Main IPC: G01N23/20
- IPC: G01N23/20

Abstract:
An X-ray diffractometer has a mechanism without toothed ring and is suited to move the two legs of a goniometer, on which the source and detector are respectively disposed, at the same time and in a correlated fashion. Each goniometer leg (or linkage) thereby has a common main center of rotation HDP and also one respective auxiliary center of rotation HD1, HD2. The two auxiliary centers of rotation are symmetrically disposed with respect to a symmetry plane E which contains the main center of rotation, and can be moved on a guidance that is symmetrical with respect to the plane E. The main center of rotation can only be moved in the plane E, e.g. along a rail guidance. The movement of the main center of rotation relative to the guidance can be easily driven by means of one single motor.
Public/Granted literature
- US20090262895A1 X-ray diffractometer for mechanically correlated movement of the source, detector, and sample position Public/Granted day:2009-10-22
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