Invention Grant
- Patent Title: Method for monitoring fabrication parameter
- Patent Title (中): 监测制造参数的方法
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Application No.: US12469051Application Date: 2009-05-20
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Publication No.: US07855086B2Publication Date: 2010-12-21
- Inventor: Yi Feng Lee , Chun Chi Chen , Yun-Zong Tian , Wei Jun Chen
- Applicant: Yi Feng Lee , Chun Chi Chen , Yun-Zong Tian , Wei Jun Chen
- Applicant Address: TW Taoyuan County
- Assignee: Inotera Memories, Inc.
- Current Assignee: Inotera Memories, Inc.
- Current Assignee Address: TW Taoyuan County
- Agency: Rosenberg, Klein & Lee
- Priority: TW98107808A 20090311
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A method for monitoring fabrication parameters comprises steps of: obtaining a normal parameter variance curve and a comparing parameter variance curve; defining a plurality of normal parameter points on the normal parameter variance curve; defining a plurality of comparing parameter points on the comparing parameter variance curve; finding out the corresponding comparing parameter points nearest to the normal parameter points; calculating the distances between the normal parameter points and the corresponding comparing parameter points thereof; summing up the distances so as to receive a total distance; and determining whether or not the total distance exceeds a limit. Via this arrangement, when fabrication parameter of tool is abnormal, it can be efficiently and immediately determined.
Public/Granted literature
- US20100233830A1 METHOD FOR MONITORING FABRICATION PARAMETER Public/Granted day:2010-09-16
Information query
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