Invention Grant
- Patent Title: Memory device bit line sensing system and method that compensates for bit line resistance variations
- Patent Title (中): 用于补偿位线电阻变化的存储器件位线检测系统和方法
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Application No.: US12569754Application Date: 2009-09-29
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Publication No.: US07855922B2Publication Date: 2010-12-21
- Inventor: Daniel Doyle , Jeffrey B. Quinn
- Applicant: Daniel Doyle , Jeffrey B. Quinn
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C7/10
- IPC: G11C7/10

Abstract:
Systems, devices and methods are disclosed, such as a system and method of sensing the voltage on bit lines that, when respective memory cells coupled to the bit lines are being read that compensates for variations in the lengths of the bit lines between the memory cells being read and respective bit line sensing circuits. The system and method may determine the length of the bit lines between the memory cells and the sensing circuits based on a memory address, such as a block address. The system and method then uses the determined length to adjust either a precharge voltage applied to the bit lines or the duration during which the bit lines are discharged by respective memory cells before respective voltages on the bit lines are latched.
Public/Granted literature
- US20100020621A1 MEMORY DEVICE BIT LINE SENSING SYSTEM AND METHOD THAT COMPENSATES FOR BIT LINE RESISTANCE VARIATIONS Public/Granted day:2010-01-28
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