Invention Grant
- Patent Title: Jiggle measuring system and jiggle measuring method
- Patent Title (中): Jiggle测量系统和摇摆测量方法
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Application No.: US12520472Application Date: 2007-12-10
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Publication No.: US07856172B2Publication Date: 2010-12-21
- Inventor: Kazuki Nishi , Masaya Oita , Yasuo Masaki
- Applicant: Kazuki Nishi , Masaya Oita , Yasuo Masaki
- Applicant Address: JP Tokyo JP Osaka
- Assignee: The University of Electro-Communications,Funai Electric Co., Ltd.
- Current Assignee: The University of Electro-Communications,Funai Electric Co., Ltd.
- Current Assignee Address: JP Tokyo JP Osaka
- Agency: Osha Liang LLP
- Priority: JP2006-345239 20061222
- International Application: PCT/JP2007/073788 WO 20071210
- International Announcement: WO2008/078537 WO 20080703
- Main IPC: G03B17/00
- IPC: G03B17/00 ; H04N5/228

Abstract:
A camera shake measurement system includes a display unit for sequentially displaying a plurality of distinguishable test patterns, a first storage unit for storing as a template each of the plurality of test patterns to be displayed, a second storage unit for storing a composite image produced by photographing at least two test patterns as still images from the plurality of test patterns to be sequentially displayed by a photographing apparatus, and a pattern recognition unit for recognizing images that match each of the templates from the composite image by calling the templates from the first storage unit, calling the composite image from the second storage unit, and moving, for each of the called templates, the template while superposing the template on the composite image.
Public/Granted literature
- US20100014846A1 JIGGLE MEASURING SYSTEM AND JIGGLE MEASURING METHOD Public/Granted day:2010-01-21
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