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US07859051B2 Semiconductor device with a reduced band gap and process 有权
具有减小的带隙和工艺的半导体器件

Semiconductor device with a reduced band gap and process
Abstract:
The application relates to a semiconductor device made of silicon with regionally reduced band gap and a process for the production of same. One embodiment provides a semiconductor device including a body zone, a drain zone and a source zone. A gate extends between the source zone and the drain zone. A reduced band gap region is provided in a region of the body zone, made of at least ternary compound semiconductor material.
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