An electronic device test apparatus comprises: a contact arm making an IC device move and pushing it against a socket 301; a control device controlling the contact arm; an instructing unit instructing the control device on a pushing torque of the contact arm; an acquiring unit acquiring from the tester the result whose a test of an IC device is executed when the contact arm pushes the IC device against the socket according to the torque instructed by the instructing unit; a correction unit correcting the torque on which the control device is instructed on the basis of the test result acquired by the acquiring unit; and a setting unit setting the stroke at the time when the test result is normal as an optimum stroke if the torque was not corrected by the correction unit.