Invention Grant
US07859674B2 System and method for measuring a harvest quality parameter on a harvesting device
有权
用于测量收获装置上收获质量参数的系统和方法
- Patent Title: System and method for measuring a harvest quality parameter on a harvesting device
- Patent Title (中): 用于测量收获装置上收获质量参数的系统和方法
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Application No.: US11942293Application Date: 2007-11-19
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Publication No.: US07859674B2Publication Date: 2010-12-28
- Inventor: Wilhelm G. Greten , Carlos Hildebrand , Roland Welle
- Applicant: Wilhelm G. Greten , Carlos Hildebrand , Roland Welle
- Applicant Address: US IA Johnston
- Assignee: Pioneer Hi-Bred International, Inc.
- Current Assignee: Pioneer Hi-Bred International, Inc.
- Current Assignee Address: US IA Johnston
- Agency: Alston & Bird LLP
- Main IPC: G01N21/55
- IPC: G01N21/55

Abstract:
A system and method for measuring a quality parameter of a harvested crop are provided. Specifically, the system is adapted to be carried by a harvesting device such that a sensor is enclosed in a controlled environment and such that the sensor is capable of precisely and reliably measuring the quality parameter while the harvesting device is in operation. The system includes a verification device and an actuator device contained within the controlled environment. The actuator device periodically conveys the sensor device to at least one of a verification position relative to the verification device and a measurement position. Thus, the sensor device may be periodically and reliably referenced and/or validated while in use in harsh agricultural environments such that the sensor device is capable of accurately measuring the quality parameter as the crop is harvested.
Public/Granted literature
- US20080137087A1 SYSTEM AND METHOD FOR MEASURING A HARVEST QUALITY PARAMETER ON A HARVESTING DEVICE Public/Granted day:2008-06-12
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