Invention Grant
- Patent Title: Fast three-dimensional shape measuring apparatus and method
- Patent Title (中): 快速三维形状测量装置及方法
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Application No.: US12388336Application Date: 2009-02-18
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Publication No.: US07859683B2Publication Date: 2010-12-28
- Inventor: Kuk-Won Ko , Young-Chul Kwon
- Applicant: Kuk-Won Ko , Young-Chul Kwon
- Applicant Address: KR Asan-si, Chungcheongnam-do
- Assignee: Industry-University Cooperation Foundation Sunmoon University
- Current Assignee: Industry-University Cooperation Foundation Sunmoon University
- Current Assignee Address: KR Asan-si, Chungcheongnam-do
- Agency: Sherr & Vaughn, PLLC
- Priority: KR10-2008-0031602 20080404
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
Disclosed herein is an apparatus for measuring the shape of a 3D object using an interferometer. The apparatus includes a light source unit, a beam splitter, a reference mirror, an actuator, an image pickup device, and a control unit. The light source unit emits light. The beam splitter divides the light from the light source unit. The reference mirror reflects light as a reference beam. The actuator moves the reference mirror. The image pickup device acquires a plurality of interference patterns by causing the reflected beam and the reference beam to interfere with each other. The control unit measures the shape of the object from the acquired interference patterns, outputs reference mirror drive signals to the actuator, and issues an image capture command at the end of image capture time that is shorter than settling time.
Public/Granted literature
- US20090251708A1 FAST THREE-DIMENSIONAL SHAPE MEASURING APPARATUS AND METHOD Public/Granted day:2009-10-08
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