Invention Grant
US07861059B2 Method for testing and programming memory devices and system for same
有权
用于测试和编程存储器件和系统的方法
- Patent Title: Method for testing and programming memory devices and system for same
- Patent Title (中): 用于测试和编程存储器件和系统的方法
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Application No.: US11051325Application Date: 2005-02-03
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Publication No.: US07861059B2Publication Date: 2010-12-28
- Inventor: Paul Magliocco , Young Cheol Kim , Richard Mark Greene , John M. Holmes
- Applicant: Paul Magliocco , Young Cheol Kim , Richard Mark Greene , John M. Holmes
- Applicant Address: US CA San Jose
- Assignee: Nextest Systems Corporation
- Current Assignee: Nextest Systems Corporation
- Current Assignee Address: US CA San Jose
- Agency: Dorsey & Whitney LLP
- Main IPC: G06F12/00
- IPC: G06F12/00 ; G06F13/00 ; G06F13/28

Abstract:
A method and system are provided for programming a plurality of memory devices arranged in parallel. In one embodiment of the present invention, the plurality of memory devices comprises first and second memory devices, and the method comprises providing successively the first address to the first memory device and the second address to the second memory device. The first address refers to a first group of storage locations in the first memory device and the second address refers to a second group of storage locations in the second memory device. The method then proceeds to load in parallel a string of data to the first and second memory devices so that the string of data is written simultaneously to the first group of storage locations in the first memory device and to the second group of storage locations in the second memory device.
Public/Granted literature
- US20050193233A1 Method for testing and programming memory devices and system for same Public/Granted day:2005-09-01
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