Invention Grant
- Patent Title: Setup and hold time characterization device and method
- Patent Title (中): 设置和保持时间表征设备和方法
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Application No.: US12054015Application Date: 2008-03-24
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Publication No.: US07861200B2Publication Date: 2010-12-28
- Inventor: Yifeng Yang , Yun Zhang , Yibin Xia , David J. Chapman
- Applicant: Yifeng Yang , Yun Zhang , Yibin Xia , David J. Chapman
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A method of characterizing a device under test (DUT) includes determining a goal function associated with a setup and hold time for the DUT. A minimum value for the goal function is determined by iteratively adjusting setup and hold times for input data to the DUT, and determining whether the DUT performs according to specifications. The minimum goal function value will reflect minimum setup and hold time values based on weights associated with the goal function. This allows the minimum setup and hold times for the DUT to be characterized with a small number of binary searches, improving the speed of the characterization process.
Public/Granted literature
- US20090241080A1 SETUP AND HOLD TIME CHARACTERIZATION DEVICE AND METHOD Public/Granted day:2009-09-24
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