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US07861432B1 Method and apparatus for hole measurement 失效
孔测量的方法和装置

  • Patent Title: Method and apparatus for hole measurement
  • Patent Title (中): 孔测量的方法和装置
  • Application No.: US11951261
    Application Date: 2007-12-05
  • Publication No.: US07861432B1
    Publication Date: 2011-01-04
  • Inventor: Alan Heimlich
  • Applicant: Alan Heimlich
  • Main IPC: G01B13/10
  • IPC: G01B13/10 ;  G01B13/16
Method and apparatus for hole measurement
Abstract:
A method and apparatus for measuring hole parameters by using a probe signal have been disclosed.
Abstract(Chinese):

已经公开了通过使用探测信号测量空穴参数的方法和装置。

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