Invention Grant
- Patent Title: Polishing apparatus and substrate processing apparatus
- Patent Title (中): 抛光装置和基板处理装置
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Application No.: US12699318Application Date: 2010-02-03
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Publication No.: US07862402B2Publication Date: 2011-01-04
- Inventor: Akihisa Hongo , Kenya Ito , Kenji Yamaguchi , Masayuki Nakanishi
- Applicant: Akihisa Hongo , Kenya Ito , Kenji Yamaguchi , Masayuki Nakanishi
- Applicant Address: JP Tokyo
- Assignee: Ebara Corporation
- Current Assignee: Ebara Corporation
- Current Assignee Address: JP Tokyo
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2004-49236 20040225
- Main IPC: B24B49/00
- IPC: B24B49/00

Abstract:
The present invention relates to a polishing apparatus for removing surface roughness produced at a peripheral portion of a substrate, or for removing a film formed on a peripheral portion of a substrate. The polishing apparatus includes a housing for forming a polishing chamber therein, a rotational table for holding and rotating a substrate, a polishing tape supply mechanism for supplying a polishing tape into the polishing chamber and taking up the polishing tape which has been supplied to the polishing chamber, a polishing head for pressing the polishing tape against a bevel portion of the substrate, a liquid supply for supplying a liquid to a front surface and a rear surface of the substrate, and a regulation mechanism for making an internal pressure of the polishing chamber being set to be lower than an external pressure of the polishing chamber.
Public/Granted literature
- US20100136886A1 POLISHING APPARATUS AND SUBSTRATE PROCESSING APPARATUS Public/Granted day:2010-06-03
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