Invention Grant
US07862772B2 Analyzer-supplying device 有权
分析仪供应装置

  • Patent Title: Analyzer-supplying device
  • Patent Title (中): 分析仪供应装置
  • Application No.: US10576429
    Application Date: 2004-10-19
  • Publication No.: US07862772B2
    Publication Date: 2011-01-04
  • Inventor: Yasuhito Murata
  • Applicant: Yasuhito Murata
  • Applicant Address: JP Kyoto
  • Assignee: ARKRAY, Inc.
  • Current Assignee: ARKRAY, Inc.
  • Current Assignee Address: JP Kyoto
  • Agency: Hamre, Schumann, Mueller & Larson, P.C.
  • Priority: JP2003-362420 20031022
  • International Application: PCT/JP2004/015414 WO 20041019
  • International Announcement: WO2005/040834 WO 20050506
  • Main IPC: G01N33/48
  • IPC: G01N33/48
Analyzer-supplying device
Abstract:
The present invention relates to a test piece supplying device (1) comprising a container (4) for containing a plurality of test pieces, and also includes a movable body (3) moving relative to the container (4) with the test piece accommodated in a recess (30) so as to take the test piece out of the container (4). The container (4) includes a sweeping portion (41) for interfering with the test pieces, in the container (4), located above the test piece accommodated in the recess (30), when the movable body (3) moves relative to the container (4). When a warped test piece accommodated in the recess (30) is moved relative to the container (4), the interfering portion (41) flattens the test strip to be accommodated in the recess (30) so that the test piece is easily taken out of the container (4).
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