Invention Grant
- Patent Title: Manufacturing method of semiconductor device
- Patent Title (中): 半导体器件的制造方法
-
Application No.: US11971085Application Date: 2008-01-08
-
Publication No.: US07863114B2Publication Date: 2011-01-04
- Inventor: Shinji Maekawa , Hidekazu Miyairi
- Applicant: Shinji Maekawa , Hidekazu Miyairi
- Applicant Address: JP Kanagawa-Ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Kanagawa-Ken
- Agency: Nixon Peabody LLP
- Agent Jeffrey L. Costellia
- Priority: JP2002-342695 20021126
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/84

Abstract:
The present invention provides a method for removing a metal element effectively from a crystalline semiconductor film obtained with the use of the metal element, without increasing the number of processes. In the present invention, an amorphous semiconductor film is formed on an insulating surface, a metal element for promoting crystallization is added to the amorphous semiconductor film, the amorphous semiconductor film is heated to form a crystallized semiconductor film, a continuous wave laser beam is irradiated to the crystallized semiconductor film, and an upper portion of the crystallized semiconductor film is removed.
Public/Granted literature
- US20080138944A1 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE Public/Granted day:2008-06-12
Information query
IPC分类: