Invention Grant
- Patent Title: High performance schottky-barrier-source asymmetric MOSFETs
- Patent Title (中): 高性能肖特基势垒源非对称MOSFET
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Application No.: US12113462Application Date: 2008-05-01
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Publication No.: US07863143B2Publication Date: 2011-01-04
- Inventor: Qingqing Liang , Huilong Zhu , Gregory G. Freeman
- Applicant: Qingqing Liang , Huilong Zhu , Gregory G. Freeman
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent H. Daniel Schnurmann
- Main IPC: H01L21/336
- IPC: H01L21/336

Abstract:
The present invention, in one embodiment, provides a semiconductor device including a semiconducting body including a schottky barrier region at a first end of the semiconducting body, a drain dopant region at the second end of the semiconducting body, and a channel positioned between the schottky barrier region and the drain dopant region. The semiconducting device may further include a gate structure overlying the channel of the semiconducting body. Further, a drain contact may be present to the drain dopant region of the semiconducting body, the drain contact being composed of a conductive material and in direct physical contact with a portion of a sidewall of the semiconducting body having a dimension that is less than a thickness of the semiconducting body in which the drain dopant region is positioned.
Public/Granted literature
- US20090273040A1 HIGH PERFORMANCE SCHOTTKY-BARRIER-SOURCE ASYMMETRIC MOSFETS Public/Granted day:2009-11-05
Information query
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