Invention Grant
- Patent Title: Manufacturing method of semiconductor device
- Patent Title (中): 半导体器件的制造方法
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Application No.: US11989328Application Date: 2006-07-21
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Publication No.: US07863154B2Publication Date: 2011-01-04
- Inventor: Shunpei Yamazaki , Ryosuke Watanabe , Jun Koyama
- Applicant: Shunpei Yamazaki , Ryosuke Watanabe , Jun Koyama
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2005-222161 20050729
- International Application: PCT/JP2006/314933 WO 20060721
- International Announcement: WO2007/013571 WO 20070201
- Main IPC: H01L21/30
- IPC: H01L21/30 ; H01L21/46 ; H01L21/00 ; G06K19/077 ; G06K19/07

Abstract:
A manufacturing method of a semiconductor device is provided, which includes a process in which a transistor is formed over a first substrate; a process in which a first insulating layer is formed over the transistor; a process in which a first conductive layer connected to a source or a drain of the transistor is formed; a process in which a second substrate provided with an second insulating layer is arranged so that the first insulating layer is attached to the second insulating layer; a process in which the second insulating layer is separated from the second substrate; and a process in which a third substrate provided with a second conductive layer which functions as an antenna is arranged so that the first conductive layer is electrically connected to the second conductive layer.
Public/Granted literature
- US20090269886A1 Manufacturing Method of Semiconductor Device Public/Granted day:2009-10-29
Information query
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