Invention Grant
- Patent Title: Variable resistance non-volatile memory cells and methods of fabricating same
- Patent Title (中): 可变电阻非易失性存储单元及其制造方法
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Application No.: US11775657Application Date: 2007-07-10
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Publication No.: US07863173B2Publication Date: 2011-01-04
- Inventor: Shin-Jae Kang , Gyuhwan Oh , Insun Park , Hyunseok Lim , Nak-Hyun Lim
- Applicant: Shin-Jae Kang , Gyuhwan Oh , Insun Park , Hyunseok Lim , Nak-Hyun Lim
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Priority: KR10-2007-0060442 20070620
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
Methods of fabricating integrated circuit memory cells and integrated circuit memory cells are disclosed. An integrated circuit memory cell can be fabricated by forming a cup-shaped electrode on sidewalls of an opening in an insulation layer and through the opening on an ohmic layer that is stacked on a conductive structure. An insulation filling member is formed that at least partially fills an interior of the electrode. The insulation filling member is formed within a range of temperatures that is sufficiently low to not substantially change resistance of the ohmic layer. A variable resistivity material is formed on the insulation filling member and is electrically connected to the electrode.
Public/Granted literature
- US20080315174A1 VARIABLE RESISTANCE NON-VOLATILE MEMORY CELLS AND METHODS OF FABRICATING SAME Public/Granted day:2008-12-25
Information query
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