Invention Grant
- Patent Title: Implantation of multiple species to address copper reliability
- Patent Title (中): 植入多种物种以解决铜的可靠性
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Application No.: US12760249Application Date: 2010-04-14
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Publication No.: US07863194B2Publication Date: 2011-01-04
- Inventor: Heyun Yin , George D. Papasouliotis , Vikram Singh
- Applicant: Heyun Yin , George D. Papasouliotis , Vikram Singh
- Applicant Address: US MA Gloucester
- Assignee: Varian Semiconductor Equipment Associates, Inc.
- Current Assignee: Varian Semiconductor Equipment Associates, Inc.
- Current Assignee Address: US MA Gloucester
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A first species and a second species are implanted into a conductor of a substrate, which may be copper. The first species and second species may be implanted sequentially or at least partly simultaneously. Diffusion of the first species within the conductor of the substrate is prevented by the presence of the second species. In one particular example, the first species is silicon and the second species is nitrogen, although other combinations are possible.
Public/Granted literature
- US20100240201A1 IMPLANTATION OF MULTIPLE SPECIES TO ADDRESS COPPER RELIABILITY Public/Granted day:2010-09-23
Information query
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