Invention Grant
- Patent Title: Non-volatile memory device and method of fabricating the same
- Patent Title (中): 非易失性存储器件及其制造方法
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Application No.: US12285403Application Date: 2008-10-03
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Publication No.: US07863672B2Publication Date: 2011-01-04
- Inventor: Young-gu Jin , Yoon-dong Park , Won-joo Kim , Suk-pil Kim , Seung-hoon Lee
- Applicant: Young-gu Jin , Yoon-dong Park , Won-joo Kim , Suk-pil Kim , Seung-hoon Lee
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2008-0005852 20080118
- Main IPC: H01L29/788
- IPC: H01L29/788 ; H01L29/792 ; H01L21/336

Abstract:
Provided are a non-volatile memory device that may expand to a stacked structure and may be more easily highly integrated and an economical method of fabricating the non-volatile memory device. The non-volatile memory device may include at least one semiconductor column. At least one first control gate electrode may be arranged on a first side of the at least one semiconductor column. At least one second control gate electrode may be arranged on a second side of the at least one semiconductor column. A first charge storage layer may be between the at least one first control gate electrode and the at least one semiconductor column. A second charge storage layer may be between the at least one second control gate electrode and the at least one semiconductor column.
Public/Granted literature
- US20090184360A1 Non-volatile memory device and method of fabricating the same Public/Granted day:2009-07-23
Information query
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