Invention Grant
- Patent Title: Semiconductor device
- Patent Title (中): 半导体器件
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Application No.: US12086886Application Date: 2006-12-20
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Publication No.: US07863713B2Publication Date: 2011-01-04
- Inventor: Tadahiro Ohmi , Akinobu Teramoto , Kazufumi Watanabe
- Applicant: Tadahiro Ohmi , Akinobu Teramoto , Kazufumi Watanabe
- Applicant Address: JP Miyagi JP Ibaraki
- Assignee: Tohoku University,Foundation for Advancement of International Science
- Current Assignee: Tohoku University,Foundation for Advancement of International Science
- Current Assignee Address: JP Miyagi JP Ibaraki
- Agency: Foley & Lardner LLP
- Priority: JP2005-369170 20051222
- International Application: PCT/JP2006/325340 WO 20061220
- International Announcement: WO2007/072844 WO 20070628
- Main IPC: H01L29/04
- IPC: H01L29/04

Abstract:
For equalizing the rising and falling operating speeds in a CMOS circuit, it is necessary to make the areas of a p-type MOS transistor and an n-type MOS transistor different from each other due to a difference in carrier mobility therebetween. This area unbalance prevents an improvement in integration degree of semiconductor devices. The NMOS transistor and the PMOS transistor each have a three-dimensional structure with a channel region on both the (100) plane and the (110) plane so that the areas of the channel regions and gate insulating films of both transistors are equal to each other. Accordingly, it is possible to make the areas of the gate insulating films and so on equal to each other and also to make the gate capacitances equal to each other. Further, the integration degree on a substrate can be improved twice as much as that in the conventional technique.
Public/Granted literature
- US20090001471A1 Semiconductor Device Public/Granted day:2009-01-01
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