Invention Grant
US07863876B2 Built-in self-calibration (BISC) technique for regulation circuits used in non-volatile memory
有权
内置自校准(BISC)技术用于非易失性存储器中使用的调节电路
- Patent Title: Built-in self-calibration (BISC) technique for regulation circuits used in non-volatile memory
- Patent Title (中): 内置自校准(BISC)技术用于非易失性存储器中使用的调节电路
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Application No.: US12055538Application Date: 2008-03-26
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Publication No.: US07863876B2Publication Date: 2011-01-04
- Inventor: Thomas D. Cook , Tahmina Akhter , Jeffrey C. Cunningham
- Applicant: Thomas D. Cook , Tahmina Akhter , Jeffrey C. Cunningham
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agency: Hamilton & Terrile, LLP
- Agent Michael Rocco Cannatti
- Main IPC: G05F1/575
- IPC: G05F1/575

Abstract:
A reference voltage regulation circuit (143) is provided in which one or more input voltage signals (Vref, Vref′) are selectively coupled to a configurable amplifier (114) which is coupled through a sample and hold circuit (120) to a voltage follower circuit (122) which is coupled in feedback to the configurable amplifier (114) for generating an adjusted output voltage at a circuit output (130), where the voltage follow circuit comprises a resistor divider circuit (126) that is controlled by a calibration signal (Cal ) generated by a counter circuit (128) selectively coupled to the output of the configurable amplifier when configured as a comparator for generating the calibration signal in response to a clock signal, where the calibration signal represents a voltage error component (Verror, Voffset) that is removed from the circuit output when the calibration signal is applied to the resistor divider circuit during normal operational.
Public/Granted literature
- US20090243571A1 Built-In Self-Calibration (BISC) Technique for Regulation Circuits Used in Non-Volatile Memory Public/Granted day:2009-10-01
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