Invention Grant
- Patent Title: Circuit board testing system using free space optical communications
- Patent Title (中): 电路板测试系统采用自由空间光通信
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Application No.: US11998607Application Date: 2007-11-30
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Publication No.: US07863912B2Publication Date: 2011-01-04
- Inventor: Charles Calvin Byers , Thomas B. Cook , Bradford Gene Van Treuren
- Applicant: Charles Calvin Byers , Thomas B. Cook , Bradford Gene Van Treuren
- Applicant Address: US NJ Murray Hill
- Assignee: Alcatel-Lucent USA Inc.
- Current Assignee: Alcatel-Lucent USA Inc.
- Current Assignee Address: US NJ Murray Hill
- Agency: Law Office of Jay M. Brown
- Main IPC: G01R31/304
- IPC: G01R31/304

Abstract:
System including backplane, and first and second circuit boards. First circuit board is attached to backplane and has first optical signal transmitter. Second circuit board is attached to backplane and has first optical signal receiver. First optical signal transmitter and first optical signal receiver are separated by free space and form optical communication link configured for circuit board test signal communication from first circuit board to second circuit board through the free space. Method includes providing backplane and first and second circuit boards, where first circuit board is attached to backplane and has first optical signal transmitter, and second circuit board is attached to backplane and has first optical signal receiver. First optical signal transmitter and first optical signal receiver are separated by free space, and form optical communication link. Method additionally includes transmitting circuit board test signal from first circuit board to second circuit board through the free space.
Public/Granted literature
- US20090140755A1 Circuit board testing system Public/Granted day:2009-06-04
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