Invention Grant
- Patent Title: Creating machine vision inspections using a state diagram representation
- Patent Title (中): 使用状态图表示来创建机器视觉检查
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Application No.: US11550510Application Date: 2006-10-18
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Publication No.: US07864178B2Publication Date: 2011-01-04
- Inventor: Marc Marini , Nicolas Vazquez
- Applicant: Marc Marini , Nicolas Vazquez
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Joel L. Stevens
- Main IPC: G06T11/20
- IPC: G06T11/20 ; G06F3/00 ; G06F3/048

Abstract:
A machine vision development environment that may utilize a control flow representation (preferably a state diagram representation) to specify and execute machine vision routines (e.g., sometimes referred to as inspection routines). A user may first create one or more machine vision routines using any of various methods. The user may then graphically specify a sequence of machine vision steps or operations, e.g., a machine vision inspection, using a state diagram representation. The state diagram representation may comprise a plurality of icons which represent states with corresponding operations or functions, such as, for example, Load Inspection, Part Ready, Run Inspection, Read Digital Input, etc. The various icons may be connected by wires that indicate control flow transitions, e.g., state transitions, among the states. The state diagram may then be executed to control the machine vision routines.
Public/Granted literature
- US20070168943A1 Creating Machine Vision Inspections Using a State Diagram Representation Public/Granted day:2007-07-19
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