Invention Grant
- Patent Title: Reflective scatterometer
- Patent Title (中): 反射散射仪
-
Application No.: US12352069Application Date: 2009-01-12
-
Publication No.: US07864324B2Publication Date: 2011-01-04
- Inventor: Deh-Ming Shyu , Yi-Sha Ku , Sen-Yih Chou , Shu-Ping Dong , Wei-Te Hsu
- Applicant: Deh-Ming Shyu , Yi-Sha Ku , Sen-Yih Chou , Shu-Ping Dong , Wei-Te Hsu
- Applicant Address: TW Hsin-Chu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsin-Chu
- Agency: Tim Tingkang Xia Morris, Manning & Martin, LLP
- Priority: TW97133614A 20080902
- Main IPC: G01N21/47
- IPC: G01N21/47

Abstract:
A reflective scatterometer capable of measuring a sample is provided. The reflective scatterometer includes a paraboloid mirror, a light source, a first reflector, a second reflector and a detector. The paraboloid mirror has an optical axis and a parabolic surface, wherein the sample is disposed on the focal point of the parabolic surface and the normal direction of the sample is parallel with the optical axis. A collimated beam generated from the light source is reflected by the first reflector to the parabolic surface and then is reflected by the parabolic surface to the sample to form a first diffracted beam. The first diffracted beam is reflected by the parabolic surface to the second reflector and is then reflected by the second reflector to the detector.
Public/Granted literature
- US20100053627A1 REFLECTIVE SCATTEROMETER Public/Granted day:2010-03-04
Information query