Invention Grant
US07864607B2 Negative voltage discharge scheme to improve snapback in a non-volatile memory
有权
负电压放电方案,以改善非易失性存储器中的快速恢复
- Patent Title: Negative voltage discharge scheme to improve snapback in a non-volatile memory
- Patent Title (中): 负电压放电方案,以改善非易失性存储器中的快速恢复
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Application No.: US11776221Application Date: 2007-07-11
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Publication No.: US07864607B2Publication Date: 2011-01-04
- Inventor: Vipul Patel , Stephen Gualandri
- Applicant: Vipul Patel , Stephen Gualandri
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dickstein Shapiro LLP
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
Charge pump and discharge circuitry for a non-volatile memory device that splits up the discharge operation into two discharge periods. In a first discharge period, the voltage being discharged (e.g., erase voltage) is discharged through a pair of discharge transistors until the discharging voltage reaches a first voltage level. The path through the pair of discharge transistors is controlled by an intermediate control voltage so that none of the transistors of the pair enter the snapback condition. In the second discharge period, the remaining discharging voltage is fully discharged from the first level through a third discharge transistor.
Public/Granted literature
- US20070258302A1 NEGATIVE VOLTAGE DISCHARGE SCHEME TO IMPROVE SNAPBACK IN A NON-VOLATILE MEMORY Public/Granted day:2007-11-08
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