Invention Grant
- Patent Title: Delay profile generator
- Patent Title (中): 延迟轮廓发生器
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Application No.: US12235818Application Date: 2008-09-23
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Publication No.: US07864664B2Publication Date: 2011-01-04
- Inventor: Hiroji Akahori
- Applicant: Hiroji Akahori
- Applicant Address: JP Tokyo
- Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Volentine & Whitt, PLLC
- Priority: JP2007-262151 20071005
- Main IPC: H04J11/00
- IPC: H04J11/00 ; H04L27/28

Abstract:
A delay profile generator that includes a delay profile generating component, a delay profile extracting component, an integrating component, a comparing component and a correcting component, is provided. The integrating component, in the delay profile extracted by the delay profile extracting component, integrates a signal component of a delay profile of a first time period, and integrates a signal component of a delay profile of a second time period that does not overlap the first time period. The comparing component compares integration values of the two time periods obtained by the integrating component. The correcting component corrects a time position of the delay profile window on the basis of results of comparison of the comparing component.
Public/Granted literature
- US20090092200A1 DELAY PROFILE GENERATOR Public/Granted day:2009-04-09
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