Invention Grant
- Patent Title: Wavelength-dispersive X-ray spectrometer
- Patent Title (中): 波长色散X射线光谱仪
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Application No.: US11514689Application Date: 2006-09-01
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Publication No.: US07864922B2Publication Date: 2011-01-04
- Inventor: Kazuyasu Kawabe
- Applicant: Kazuyasu Kawabe
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2005-253658 20050901; JP2006-143803 20060524
- Main IPC: G21K1/06
- IPC: G21K1/06

Abstract:
An X-ray spectrometer which uses at least one curved analyzing crystal and which provides improved wavelength resolution of characteristic X-rays used for analysis and improved ratio of characteristic X-rays to background intensity by using only effective diffractive regions of the analyzing crystal. X-ray blocking plates upstand from an end of a crystal support member supporting the analyzing crystal in the direction of angular dispersion of the crystal toward the inside of a Rowland circle. Incident X-rays going from the point X-ray source toward the crystal and X-rays diffracted by the crystal toward an X-ray detector are partially blocked by the X-ray blocking plates. The shielded regions vary according to the incident angle θ of the incident X-rays. Optimum or nearly optimum effective regions of the surface of the crystal can be used at all times.
Public/Granted literature
- US20100284513A1 Wavelength-dispersive X-ray spectrometer Public/Granted day:2010-11-11
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