Invention Grant
US07864922B2 Wavelength-dispersive X-ray spectrometer 有权
波长色散X射线光谱仪

  • Patent Title: Wavelength-dispersive X-ray spectrometer
  • Patent Title (中): 波长色散X射线光谱仪
  • Application No.: US11514689
    Application Date: 2006-09-01
  • Publication No.: US07864922B2
    Publication Date: 2011-01-04
  • Inventor: Kazuyasu Kawabe
  • Applicant: Kazuyasu Kawabe
  • Applicant Address: JP Tokyo
  • Assignee: JEOL Ltd.
  • Current Assignee: JEOL Ltd.
  • Current Assignee Address: JP Tokyo
  • Agency: The Webb Law Firm
  • Priority: JP2005-253658 20050901; JP2006-143803 20060524
  • Main IPC: G21K1/06
  • IPC: G21K1/06
Wavelength-dispersive X-ray spectrometer
Abstract:
An X-ray spectrometer which uses at least one curved analyzing crystal and which provides improved wavelength resolution of characteristic X-rays used for analysis and improved ratio of characteristic X-rays to background intensity by using only effective diffractive regions of the analyzing crystal. X-ray blocking plates upstand from an end of a crystal support member supporting the analyzing crystal in the direction of angular dispersion of the crystal toward the inside of a Rowland circle. Incident X-rays going from the point X-ray source toward the crystal and X-rays diffracted by the crystal toward an X-ray detector are partially blocked by the X-ray blocking plates. The shielded regions vary according to the incident angle θ of the incident X-rays. Optimum or nearly optimum effective regions of the surface of the crystal can be used at all times.
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