Invention Grant
- Patent Title: Device and method for correcting defects in x-ray images
- Patent Title (中): 用于校正X射线图像缺陷的装置和方法
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Application No.: US10595967Application Date: 2004-11-23
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Publication No.: US07864993B2Publication Date: 2011-01-04
- Inventor: Hanns-Ingo Maack , Andreas Kloessner
- Applicant: Hanns-Ingo Maack , Andreas Kloessner
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP03104503 20031202
- International Application: PCT/IB2004/052518 WO 20041123
- International Announcement: WO2005/055140 WO 20050616
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method for correcting defects in X-ray images includes identifying potentially defective picture elements (p) in X-ray images (I), created during normal operation, by comparing a value (W(p)) of the picture elements with corresponding values in a neighborhood (n(p)). If a picture element (p) has been classified as “potentially defective” in more than a specified percentage of X-ray images, it is entered in a defect map which is refreshed on a continuous basis. The defect map can then be used to correct other X-ray images.
Public/Granted literature
- US20070165934A1 Device and method for correcting defects in x-ray images Public/Granted day:2007-07-19
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