Invention Grant
- Patent Title: Methods and apparatus for outlier detection for high dimensional data sets
- Patent Title (中): 用于高维数据集异常检测的方法和装置
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Application No.: US12134371Application Date: 2008-06-06
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Publication No.: US07865456B2Publication Date: 2011-01-04
- Inventor: Charu C. Aggarwal , Philip Shi-Lung Yu
- Applicant: Charu C. Aggarwal , Philip Shi-Lung Yu
- Applicant Address: JP Tokyo
- Assignee: Trend Micro Incorporated
- Current Assignee: Trend Micro Incorporated
- Current Assignee Address: JP Tokyo
- Agency: Okamoto & Benedicto LLP
- Main IPC: G06N5/00
- IPC: G06N5/00

Abstract:
Methods and apparatus are provided for outlier detection in databases by determining sparse low dimensional projections. These sparse projections are used for the purpose of determining which points are outliers. The methodologies of the invention are very relevant in providing a novel definition of exceptions or outliers for the high dimensional domain of data.
Public/Granted literature
- US20080234977A1 Methods and Apparatus for Outlier Detection for High Dimensional Data Sets Public/Granted day:2008-09-25
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06N | 基于特定计算模型的计算机系统 |
G06N5/00 | 利用基于知识的模式的计算机系统 |