Invention Grant
US07865456B2 Methods and apparatus for outlier detection for high dimensional data sets 有权
用于高维数据集异常检测的方法和装置

Methods and apparatus for outlier detection for high dimensional data sets
Abstract:
Methods and apparatus are provided for outlier detection in databases by determining sparse low dimensional projections. These sparse projections are used for the purpose of determining which points are outliers. The methodologies of the invention are very relevant in providing a novel definition of exceptions or outliers for the high dimensional domain of data.
Information query
Patent Agency Ranking
0/0