Invention Grant
- Patent Title: Programmable clock control architecture for at-speed testing
- Patent Title (中): 用于高速测试的可编程时钟控制架构
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Application No.: US11801817Application Date: 2007-05-10
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Publication No.: US07865759B2Publication Date: 2011-01-04
- Inventor: Zaifu Zhang , Kevin Mun-Wah Chan , Brian Rust
- Applicant: Zaifu Zhang , Kevin Mun-Wah Chan , Brian Rust
- Applicant Address: US CA Irvine
- Assignee: Broadcom Corporation
- Current Assignee: Broadcom Corporation
- Current Assignee Address: US CA Irvine
- Agency: Farjami & Farjami LLP
- Main IPC: G06F1/04
- IPC: G06F1/04

Abstract:
According to one exemplary embodiment, an N-stage programmable clock control architecture includes N flip-flops, where the N flip-flops are clocked by a primary clock source, such as a PLL. The N-stage programmable clock control architecture further includes means for programming the N flip-flops such that the N-stage programmable clock control architecture outputs N programmed at-speed clock pulses. For example, when N is equal to 3, three programmed clock pulses can be outputted by the N-stage programmable clock control architecture, with a total of eight different patterns of programmed clock pulses. The N-stage programmable clock control architecture can thus adequately test, for example, combinational logic requiring greater than two consecutive clock pulses for complete at-speed testing. In one embodiment, scan-shift registers can be utilized to program the N flip-flops. In another embodiment, a look-up table can be used to program the N flip-flops.
Public/Granted literature
- US20080278205A1 Programmable clock control architecture for at-speed testing Public/Granted day:2008-11-13
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