Invention Grant
- Patent Title: Substrate of probe card and method for regenerating thereof
- Patent Title (中): 探针卡基片及其再生方法
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Application No.: US12087270Application Date: 2006-12-29
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Publication No.: US07867790B2Publication Date: 2011-01-11
- Inventor: Jung-Sun Yoo , Seong-Hoon Jeong
- Applicant: Jung-Sun Yoo , Seong-Hoon Jeong
- Applicant Address: KR Seoul
- Assignee: Phicom Corporation
- Current Assignee: Phicom Corporation
- Current Assignee Address: KR Seoul
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2005-0133906 20051229
- International Application: PCT/KR2006/005878 WO 20061229
- International Announcement: WO2007/075070 WO 20070705
- Main IPC: G01R31/26
- IPC: G01R31/26 ; H01R9/00

Abstract:
Provided are a substrate of a probe card for installing a plurality of probes thereon to inspect an object by contacting the probes to the object, and a method for repairing the substrate. The substrate includes main channels electrically connected to the probes; and at least one spare channel for replacing the main channels when at least one of the main channels is damaged. Therefore, when some of the main channels of the probe substrate are damaged, the damaged main channels can be repaired using the spare channels and then the probe substrate can be reused, thereby reducing costs required for unnecessary replacement.
Public/Granted literature
- US20090002005A1 Substrate Probe Card and Method for Regenerating Thereof Public/Granted day:2009-01-01
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