Invention Grant
- Patent Title: Low leakage protection device
- Patent Title (中): 低漏电保护装置
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Application No.: US12139244Application Date: 2008-06-13
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Publication No.: US07868387B2Publication Date: 2011-01-11
- Inventor: Javier A. Salcedo , Jean-Jacques Hajjar , Todd Thomas
- Applicant: Javier A. Salcedo , Jean-Jacques Hajjar , Todd Thomas
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Sunstein Kann Murphy & Timbers LLP
- Main IPC: H01L23/60
- IPC: H01L23/60

Abstract:
A high-voltage, low-leakage, bidirectional electrostatic discharge (ESD, or other electrical overstress) protection device includes a doped well disposed between the terminal regions and the substrate. The device includes an embedded diode for conducting current in one direction, and a transistor feedback circuit for conducting current in the other direction. Variations in the dimensions and doping of the doped well, as well as external passive reference via resistor connections, allow the circuit designer to flexibly adjust the operating characteristics of the device, such as trigger voltage and turn-on speed, to suit the required mixed-signal operating conditions.
Public/Granted literature
- US20090309128A1 Low Leakage Protection Device Public/Granted day:2009-12-17
Information query
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