Invention Grant
- Patent Title: Method and a device for measuring dielectric characteristics of material bodies
- Patent Title (中): 用于测量材料体介电特性的方法和装置
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Application No.: US12537771Application Date: 2009-08-07
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Publication No.: US07868627B2Publication Date: 2011-01-11
- Inventor: Ivan I. Turkovskyi
- Applicant: Ivan I. Turkovskyi
- Applicant Address: RU St. Petersburg
- Assignee: Joint-Stock Company ‘High Tech’
- Current Assignee: Joint-Stock Company ‘High Tech’
- Current Assignee Address: RU St. Petersburg
- Agency: Houston Eliseeva, LLP
- Priority: RU2007107047 20070214
- Main IPC: G01R27/00
- IPC: G01R27/00 ; G01R31/12 ; G01N21/17

Abstract:
A method and a device for measuring dielectric characteristics by generating a microwave signal, dividing the signal into reference and sounding signals, irradiating a body with the microwave signal, receiving the reflected, reference and total signals and in detecting said signals. The irradiation is carried out by a waveguide wave, the wave number of which in the free space filled with dielectric, is selected within a range from 1.0 to 1.07 the propagation number of the waveguide wave.
Public/Granted literature
- US20100001747A1 METHOD AND A DEVICE FOR MEASURING DIELECTRIC CHARACTERISTICS OF MATERIAL BODIES Public/Granted day:2010-01-07
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