Invention Grant
US07868637B2 System and method for automated detection of singular faults in diode or'd power bus circuits
有权
用于自动检测二极管或电源总线电路中奇异故障的系统和方法
- Patent Title: System and method for automated detection of singular faults in diode or'd power bus circuits
- Patent Title (中): 用于自动检测二极管或电源总线电路中奇异故障的系统和方法
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Application No.: US11974620Application Date: 2007-10-15
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Publication No.: US07868637B2Publication Date: 2011-01-11
- Inventor: Steven A. Avritch , Gary L. Hess
- Applicant: Steven A. Avritch , Gary L. Hess
- Applicant Address: US IL Rockford
- Assignee: Hamilton Sundstrand Corporation
- Current Assignee: Hamilton Sundstrand Corporation
- Current Assignee Address: US IL Rockford
- Agency: Kinney & Lange, P.A.
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
A system automatically detects singular faults in diode or'd power bus circuit comprised of a plurality of diodes. The system includes a diode test circuit that selectively applies a voltage pulse to one of the plurality of diodes and detects the presence of singular faults based on the monitored response to the voltage pulse.
Public/Granted literature
- US20090096479A1 System and method for automated detection of singular faults in diode or'd power bus circuits Public/Granted day:2009-04-16
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