Invention Grant
US07869028B2 Apparatus for the electromagnetic spectrum or optical analysis, in particular photometric, spectrophotometric or image analysis
有权
用于电磁谱或光学分析的装置，特别是光度测定，分光光度法或图像分析
- Patent Title: Apparatus for the electromagnetic spectrum or optical analysis, in particular photometric, spectrophotometric or image analysis
- Patent Title (中): 用于电磁谱或光学分析的装置，特别是光度测定，分光光度法或图像分析
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Application No.: US11995403Application Date: 2006-05-12
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Publication No.: US07869028B2Publication Date: 2011-01-11
- Inventor: Joachim Mannhardt , Trevor Page
- Applicant: Joachim Mannhardt , Trevor Page
- Applicant Address: DE Eschach GB Southampton
- Assignee: Joachim Mannhardt,Trevor Page
- Current Assignee: Joachim Mannhardt,Trevor Page
- Current Assignee Address: DE Eschach GB Southampton
- Agency: Phelps Dunbar LLP
- Agent Harvey S. Kauget
- Priority: DE202005011177U 20050715
- International Application: PCT/EP2006/004496 WO 20060512
- International Announcement: WO2007/009522 WO 20070125
- Main IPC: G01N1/10
- IPC: G01N1/10 ; G01N21/00
Abstract:
An apparatus for the electromagnetic spectrum or optical analysis of a material. The apparatus comprising a measuring probe having a housing with at least one radiation or light measuring element, a measuring window and with at least one detection element for the analysis. The measuring probe is formed and guided displaceably in the axial direction in such a way that at least part of the housing in which the measuring window is located enters through an opening in which the material to be analyzed is located for the analysis. The at least one measuring window is arranged in at least one subregion of the circumferential wall of the housing. A sealing cap is located between a front end face of the housing and the measuring window arranged in the circumferential wall and consequently covers the opening in a retracted position of the measuring probe.
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