Invention Grant
- Patent Title: Multi-angle and multi-channel inspecting device
- Patent Title (中): 多角度多通道检测装置
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Application No.: US11734794Application Date: 2007-04-13
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Publication No.: US07869034B2Publication Date: 2011-01-11
- Inventor: Hau-Wei Wang , Fu-Shiang Yang , Yu-Shan Chang
- Applicant: Hau-Wei Wang , Fu-Shiang Yang , Yu-Shan Chang
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Priority: TW95129853A 20060815
- Main IPC: G01J3/28
- IPC: G01J3/28
Abstract:
A multi-angle and multi-channel detecting device for detecting one or more than one samples is provided. The device has a light collector and a multi-channel kernel module. The light collector has a plurality of fiber probes arranged perpendicular to and/or inclined to the sample(s) so as to collect light signals. The kernel module is coupled to the light collector for detecting the sample(s).
Public/Granted literature
- US20080043232A1 MULTI-ANGLE AND MULTI-CHANNEL INSPECTING DEVICE Public/Granted day:2008-02-21
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