Invention Grant
- Patent Title: Dynamic type semiconductor memory device and operation method of the same
- Patent Title (中): 动态型半导体存储器件及其操作方法
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Application No.: US12502692Application Date: 2009-07-14
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Publication No.: US07869292B2Publication Date: 2011-01-11
- Inventor: Nobumitsu Yano , Shogo Tanabe
- Applicant: Nobumitsu Yano , Shogo Tanabe
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Young & Thompson
- Priority: JP2008-182986 20080714
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A dynamic type semiconductor memory device includes a sense amplifier connected with a bit line pair to amplify and sense a voltage difference on the bit line pair; a precharge circuit configured to precharge the bit line pair to a power supply voltage on a lower side in response to a first control signal; a memory cell capacitance having one end which is connected with the bit line pair through a first switch circuit which is controlled in response to a signal on a word line; and a reference cell capacitance having one end which is connected with the bit line pair through a second switch circuit which is controlled in response to a signal on a reference word line. The other end of the memory cell capacitance and the other end of the reference cell capacitance are electrically separated.
Public/Granted literature
- US20100008172A1 DYNAMIC TYPE SEMICONDUCTOR MEMORY DEVICE AND OPERATION METHOD OF THE SAME Public/Granted day:2010-01-14
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