Invention Grant
- Patent Title: X-ray detector methods and apparatus
- Patent Title (中): X射线检测器的方法和装置
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Application No.: US11551019Application Date: 2006-10-19
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Publication No.: US07869559B2Publication Date: 2011-01-11
- Inventor: Abdelaziz Ikhlef , Charles Hugh Shaughnessy
- Applicant: Abdelaziz Ikhlef , Charles Hugh Shaughnessy
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: ZPS Group, SC
- Main IPC: A61B6/00
- IPC: A61B6/00
Abstract:
A method includes performing an x-ray focal spot deflection to generate two complete projections from two different channels of an x-ray detector, wherein the channels are purposefully different from each other in some respect other than being different channels.
Public/Granted literature
- US20080101534A1 X-Ray Detector Methods and Apparatus Public/Granted day:2008-05-01
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