Invention Grant
- Patent Title: Image capture and calibratiion
- Patent Title (中): 图像捕获和校准
-
Application No.: US12177700Application Date: 2008-07-22
-
Publication No.: US07869645B2Publication Date: 2011-01-11
- Inventor: Ali Zandifar
- Applicant: Ali Zandifar
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
Embodiments of the present invention enable image capture and validation. Certain applications of the present invention are its use in various embodiments of a system for inspection of a printed circuit board (“PCB”) substrate. In embodiments, an image capture system comprising a camera and a two-dimensional surface supporting an image may be calibrated based on configuration parameters of an image to be captured and of a simulated reference bitmap based on the image. In embodiments, the position of the image to be captured on the two-dimensional surface is determined based on calibration parameters. In embodiments, consistency of quality of captured images is maintained by validating selected characteristics of each image as it is being captured.
Public/Granted literature
- US20100021044A1 Image Capture and Calibratiion Public/Granted day:2010-01-28
Information query